Field Emission Scanning Electron Microscope (FESEM)
Source: Schottky field emitter
Probe Current: 3pA to 100nA
Resolution: 0.8 nm
Max. weight of the sample: 0.5 kg
Magnification: 50X to 2000000X
Mode: Only high vacuum (HV)
Accessories available: EDAX, BSE
Applications: Surface morphology, Elemental analysis, Particle size distribution
Sample: Solid, Powder, Dry biological samples.
FESEM Requisition form (External): Download
Powder X-Ray Diffraction (PXRD)
X-Ray Source: 2.2 kW Cu anode long fine focus ceramic X-ray tube
Running condition power supply: 40 kV and 40 mA
- Max. sample weight, depending on sample holder: 250 g
- Max. sample height, depending on sample holder: 25 mm
- Max. sample diameter: 70 mm
- Phase Composition of a Sample
- Quantitative Phase Analysis: determine the relative amounts of phases in a mixture by referencing the relative peak intensities.
- Unit cell lattice parameters and Bravais lattice symmetry
- Index peak positions
- Lattice parameters can vary as a function of, and therefore give you information about, alloying, doping, solid solutions, strains, etc.
- Residual Strain (macrostrain)
- Crystal Structure
- By Rietveld refinement of the entire diffraction pattern
- Variable temperature analysis
- Capillary measurements
- Crystallite Size and Micro strain
Sample: Solid, Thin films and powder
- Indicated by peak broadening.
- Other defects (stacking faults, etc.) can be measured by analysis of peak shapes and peak width.
PXRD Requisition form (External): Download
Atomic Force Microscope (AFM)
• Sample Size: 210mm vacuum chuck for samples, ≤ 210mm diameter, ≤15mm thick
• X-Y Position Noise: ≤0.15nm RMS typical imaging bandwidth (up to 625Hz)
• Z Sensor Noise Level: 35pm RMS typical imaging bandwidth (up to 625Hz)
• X-Y Imaging Area: 90µm x 90µm typical
• Z range: 10µm typical in imaging and force curve modes
• Identification of surface topography.
• Identification of nature of interaction between specific atom and its neighbouring.
• Electric properties can be measured by using conducting probes.
• Work function measurement using KPFM.
• Atomic level manipulations can also be done.
AFM Requisition form (External): Download