Field Emission Scanning Electron Microscope (FESEM)

Source: Schottky field emitter
Probe Current: 3pA to 100nA
Resolution: 0.8 nm
Max. weight of the sample: 0.5 kg
Magnification: 50X to 2000000X
Mode: Only high vacuum (HV)
Accessories available: EDAX, BSE
Applications: Surface morphology, Elemental analysis, Particle size distribution
Sample: Solid, Powder, Dry biological samples.
FESEM Requisition form (External): Download

Powder X-Ray Diffraction (PXRD)

Make & Model: Bruker D8 Advance A25
X-Ray Source: 2.2 kW Cu anode long fine focus ceramic X-ray tube
Running condition power supply: 40 kV and 40 mA
  • Max. sample weight, depending on sample holder: 250 g
  • Max. sample height, depending on sample holder: 25 mm
  • Max. sample diameter: 70 mm
  • Phase Composition of a Sample
    • Quantitative Phase Analysis: determine the relative amounts of phases in a mixture by referencing the relative peak intensities.
  • Unit cell lattice parameters and Bravais lattice symmetry
    • Index peak positions
    • Lattice parameters can vary as a function of, and therefore give you information about, alloying, doping, solid solutions, strains, etc.
  • Residual Strain (macrostrain)
  • Crystal Structure
    • By Rietveld refinement of the entire diffraction pattern
  • Epitaxy/Texture/Orientation
  • Variable temperature analysis
  • Capillary measurements
  • Crystallite Size and Micro strain
    • Indicated by peak broadening.
    • Other defects (stacking faults, etc.) can be measured by analysis of peak shapes and peak width.
  • Sample: Solid, Thin films and powder
    PXRD Requisition form (External): Download

Atomic Force Microscope (AFM)

Make&Model: Bruker, Dimension Icon
• Sample Size: 210mm vacuum chuck for samples, ≤ 210mm diameter, ≤15mm thick
• X-Y Position Noise: ≤0.15nm RMS typical imaging bandwidth (up to 625Hz)
• Z Sensor Noise Level: 35pm RMS typical imaging bandwidth (up to 625Hz)
• X-Y Imaging Area: 90µm x 90µm typical
• Z range: 10µm typical in imaging and force curve modes
• Identification of surface topography.
• Identification of nature of interaction between specific atom and its neighbouring.
• Electric properties can be measured by using conducting probes.
• Work function measurement using KPFM.
• Atomic level manipulations can also be done.
AFM Requisition form (External): Download

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